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Defects control in semiconductors : proceedings of the conference on the science and technology of defect control in semiconductors, The Yokohama 21st century forum, Yokohama, Japan, Sept. 17-22: 1989
| Huvudupphovsman: | |
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| Institutionell upphovsman: | |
| Materialtyp: | Printed Book |
| Språk: | English |
| Publicerad: |
Amsterdam
North-Holland
1990
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| Ämnen: |
UL
| Signum: |
621.382:620.1 SUM |
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| Exemplar | Status otillgänglig |