Defects control in semiconductors : proceedings of the conference on the science and technology of defect control in semiconductors, The Yokohama 21st century forum, Yokohama, Japan, Sept. 17-22: 1989

Bibliografski detalji
Glavni autor: Sumib, K. [ed.] (ed.by)
Autor kompanije: International conference on the science and technology of defect control in semiconductors
Format: Printed Book
Jezik:English
Izdano: Amsterdam North-Holland 1990
Teme:
Semiconductors - defect control

UL

Detalji primjeraka od UL
Signatura: 621.382:620.1 SUM
Primjerak Prikaz statusa u stvarnom vremenu nije dostupan

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