Lanean...
Defects control in semiconductors : proceedings of the conference on the science and technology of defect control in semiconductors, The Yokohama 21st century forum, Yokohama, Japan, Sept. 17-22: 1989
| Egile nagusia: | |
|---|---|
| Erakunde egilea: | |
| Formatua: | Printed Book |
| Hizkuntza: | English |
| Argitaratua: |
Amsterdam
North-Holland
1990
|
| Gaiak: |
UL
| Sailkapena: |
621.382:620.1 SUM |
|---|---|
| Alea | Egoera zuzenean ez dago erabilgarri |