Cargando...
Defects control in semiconductors : proceedings of the conference on the science and technology of defect control in semiconductors, The Yokohama 21st century forum, Yokohama, Japan, Sept. 17-22: 1989
| Autor principal: | |
|---|---|
| Autor Corporativo: | |
| Formato: | Printed Book |
| Lenguaje: | English |
| Publicado: |
Amsterdam
North-Holland
1990
|
| Materias: |
UL
| Número de Clasificación: |
621.382:620.1 SUM |
|---|---|
| Copia | Estatus de actividad no disponible |