Llwytho...

Defects control in semiconductors : proceedings of the conference on the science and technology of defect control in semiconductors, The Yokohama 21st century forum, Yokohama, Japan, Sept. 17-22: 1989

Manylion Llyfryddiaeth
Prif Awdur: Sumib, K. [ed.] (ed.by)
Awdur Corfforaethol: International conference on the science and technology of defect control in semiconductors
Fformat: Printed Book
Iaith:English
Cyhoeddwyd: Amsterdam North-Holland 1990
Pynciau:

UL

Manylion daliadau o UL
Rhif Galw: 621.382:620.1 SUM
Copi Nid yw'r Statws Byw ar Gael