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Defects control in semiconductors : proceedings of the conference on the science and technology of defect control in semiconductors, The Yokohama 21st century forum, Yokohama, Japan, Sept. 17-22: 1989
| Hoofdauteur: | |
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| Coauteur: | |
| Formaat: | Printed Book |
| Taal: | English |
| Gepubliceerd in: |
Amsterdam
North-Holland
1990
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| Onderwerpen: |
UL
| Plaatsingsnummer: |
621.382:620.1 SUM |
|---|---|
| Kopie | Status is onbeschikbaar |