Defects control in semiconductors : proceedings of the conference on the science and technology of defect control in semiconductors, The Yokohama 21st century forum, Yokohama, Japan, Sept. 17-22: 1989

Bibliographic Details
Main Author: Sumib, K. [ed.] (ed.by)
Corporate Author: International conference on the science and technology of defect control in semiconductors
Format: Printed Book
Language:English
Published: Amsterdam North-Holland 1990
Subjects:
Semiconductors - defect control

UL

Holdings details from UL
Call Number: 621.382:620.1 SUM
Copy Live Status Unavailable

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