Defects control in semiconductors : proceedings of the conference on the science and technology of defect control in semiconductors, The Yokohama 21st century forum, Yokohama, Japan, Sept. 17-22: 1989

Ítems similars

• Photoinduced defects in semiconductors
  per: Redfield, David
  Publicat: (1996)
• Photoinduced defects in semiconductors /
  per: Redfield, David
  Publicat: (1996)
• Defects control in semiconductors: Proceedings of the conference on the science and technology of defect control in semiconductors,...
  Publicat: (1990)
• Extended defects in semiconductors : electronic properties, device effects and structures /
  per: Holt, D. B.
  Publicat: (2007)
• Extended defects in semiconductors: electronic properties, device effects and structures
  per: Holt, D. B. and Yacobi, B. G.
  Publicat: (2007)