Defects control in semiconductors : proceedings of the conference on the science and technology of defect control in semiconductors, The Yokohama 21st century forum, Yokohama, Japan, Sept. 17-22: 1989

Схожие документы

• Photoinduced defects in semiconductors
  по: Redfield, David
  Опубликовано: (1996)
• Photoinduced defects in semiconductors /
  по: Redfield, David
  Опубликовано: (1996)
• Defects control in semiconductors: Proceedings of the conference on the science and technology of defect control in semiconductors,...
  Опубликовано: (1990)
• Extended defects in semiconductors : electronic properties, device effects and structures /
  по: Holt, D. B.
  Опубликовано: (2007)
• Extended defects in semiconductors: electronic properties, device effects and structures
  по: Holt, D. B. and Yacobi, B. G.
  Опубликовано: (2007)