Defects control in semiconductors : proceedings of the conference on the science and technology of defect control in semiconductors, The Yokohama 21st century forum, Yokohama, Japan, Sept. 17-22: 1989

Detalles Bibliográficos
Autor Principal: Sumib, K. [ed.] (ed.by)
Autor Corporativo: International conference on the science and technology of defect control in semiconductors
Formato: Printed Book
Idioma:English
Publicado: Amsterdam North-Holland 1990
Subjects:
Semiconductors - defect control
Descripción
ISBN:0-444-88429-7

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