Sumib, K. [. (1990). Defects control in semiconductors: Proceedings of the conference on the science and technology of defect control in semiconductors, The Yokohama 21st century forum, Yokohama, Japan, Sept. 17-22: 1989. North-Holland.
Citação norma ChicagoSumib, K. [ed.]. Defects Control in Semiconductors: Proceedings of the Conference on the Science and Technology of Defect Control in Semiconductors, The Yokohama 21st Century Forum, Yokohama, Japan, Sept. 17-22: 1989. Amsterdam: North-Holland, 1990.
Citação norma MLASumib, K. [ed.]. Defects Control in Semiconductors: Proceedings of the Conference on the Science and Technology of Defect Control in Semiconductors, The Yokohama 21st Century Forum, Yokohama, Japan, Sept. 17-22: 1989. North-Holland, 1990.