Á lódáil...
Microstructural characterization of materials /
| Príomhúdar: | Brandon, D. G. |
|---|---|
| Údair Eile: | Kaplan, Wayne D. |
| Formáid: | Printed Book |
| Teanga: | English |
| Foilsithe: |
Chichester, England :
John Wiley & Sons,
c2008.
|
| Eagrán: | 2nd ed. |
| Sraith: | Quantitative software engineering series
|
| Ábhair: | |
| Rochtain Ar Líne: | http://www.loc.gov/catdir/enhancements/fy0827/2007041704-d.html http://www.loc.gov/catdir/enhancements/fy0827/2007041704-t.html |
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