Á lódáil...
Photoinduced defects in semiconductors
| Príomhúdar: | Redfield, David |
|---|---|
| Údair Eile: | Bube, Richard H. |
| Formáid: | Printed Book |
| Teanga: | English |
| Foilsithe: |
Cambridge
Cambridge University
1996
|
| Sraith: | (Cambridge studies in semiconductors physics and microelectronic Engineering)
|
| Ábhair: |
Míreanna Comhchosúla
-
Photoinduced defects in semiconductors /
le: Redfield, David
Foilsithe: (1996) -
Photoinduced defects in semiconductors
le: Redfield,David
Foilsithe: (1996) -
Extended defects in semiconductors : electronic properties, device effects and structures /
le: Holt, D. B.
Foilsithe: (2007) -
Extended defects in semiconductors: electronic properties, device effects and structures
le: Holt, D. B. and Yacobi, B. G.
Foilsithe: (2007) -
Defects control in semiconductors : proceedings of the conference on the science and technology of defect control in semiconductors, The Yokohama 21st century forum, Yokohama, Japan, Sept. 17-22: 1989
le: Sumib, K. [ed.]
Foilsithe: (1990)