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Photoinduced defects in semiconductors
| Κύριος συγγραφέας: | Redfield, David |
|---|---|
| Άλλοι συγγραφείς: | Bube, Richard H. |
| Μορφή: | Printed Book |
| Γλώσσα: | English |
| Έκδοση: |
Cambridge
Cambridge University
1996
|
| Σειρά: | (Cambridge studies in semiconductors physics and microelectronic Engineering)
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| Θέματα: |
Παρόμοια τεκμήρια
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Photoinduced defects in semiconductors /
ανά: Redfield, David
Έκδοση: (1996) -
Photoinduced defects in semiconductors
ανά: Redfield,David
Έκδοση: (1996) -
Extended defects in semiconductors : electronic properties, device effects and structures /
ανά: Holt, D. B.
Έκδοση: (2007) -
Extended defects in semiconductors: electronic properties, device effects and structures
ανά: Holt, D. B. and Yacobi, B. G.
Έκδοση: (2007) -
Defects control in semiconductors : proceedings of the conference on the science and technology of defect control in semiconductors, The Yokohama 21st century forum, Yokohama, Japan, Sept. 17-22: 1989
ανά: Sumib, K. [ed.]
Έκδοση: (1990)