Photoinduced defects in semiconductors

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Bibliographic Details
Main Author: Redfield, David
Other Authors: Bube, Richard H.
Format: Printed Book
Language:English
Published: Cambridge Cambridge University 1996
Series:(Cambridge studies in semiconductors physics and microelectronic Engineering)
Subjects:
Semiconductors-defects > Photochemistry-semiconductors

UL

Holdings details from UL
Call Number: 621.3.032:541.14 RED
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