Fault injection techniques and tools for embedded systems reliability evaluation /

Detalhes bibliográficos
Outros Autores: Benso, Alfredo, Prinetto, Paolo
Formato: Printed Book
Idioma:English
Publicado em: Boston : Kluwer Academic Publishers, c2003.
Colecção:Frontiers in electronic testing ;
Assuntos:
Embedded computer systems > Testing.
Embedded computer systems > Reliability.
Fault location (Engineering)
Acesso em linha:http://www.loc.gov/catdir/enhancements/fy0821/2003061871-d.html
http://www.loc.gov/catdir/enhancements/fy0821/2003061871-t.html

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http://www.loc.gov/catdir/enhancements/fy0821/2003061871-d.html
http://www.loc.gov/catdir/enhancements/fy0821/2003061871-t.html

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