Fault injection techniques and tools for embedded systems reliability evaluation /

Détails bibliographiques
Autres auteurs: Benso, Alfredo, Prinetto, Paolo
Format: Printed Book
Langue:English
Publié: Boston : Kluwer Academic Publishers, c2003.
Collection:Frontiers in electronic testing ;
Sujets:
Embedded computer systems > Testing.
Embedded computer systems > Reliability.
Fault location (Engineering)
Accès en ligne:http://www.loc.gov/catdir/enhancements/fy0821/2003061871-d.html
http://www.loc.gov/catdir/enhancements/fy0821/2003061871-t.html

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http://www.loc.gov/catdir/enhancements/fy0821/2003061871-d.html
http://www.loc.gov/catdir/enhancements/fy0821/2003061871-t.html

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