Fault injection techniques and tools for embedded systems reliability evaluation /

Bibliografische gegevens
Andere auteurs: Benso, Alfredo, Prinetto, Paolo
Formaat: Printed Book
Taal:English
Gepubliceerd in: Boston : Kluwer Academic Publishers, c2003.
Reeks:Frontiers in electronic testing ;
Onderwerpen:
Embedded computer systems > Testing.
Embedded computer systems > Reliability.
Fault location (Engineering)
Online toegang:http://www.loc.gov/catdir/enhancements/fy0821/2003061871-d.html
http://www.loc.gov/catdir/enhancements/fy0821/2003061871-t.html

Gelijkaardige items

Gelijkaardige items