Fault injection techniques and tools for embedded systems reliability evaluation /

Detalles Bibliográficos
Outros autores: Benso, Alfredo, Prinetto, Paolo
Formato: Printed Book
Idioma:English
Publicado: Boston : Kluwer Academic Publishers, c2003.
Series:Frontiers in electronic testing ;
Subjects:
Embedded computer systems > Testing.
Embedded computer systems > Reliability.
Fault location (Engineering)
Acceso en liña:http://www.loc.gov/catdir/enhancements/fy0821/2003061871-d.html
http://www.loc.gov/catdir/enhancements/fy0821/2003061871-t.html

Internet

http://www.loc.gov/catdir/enhancements/fy0821/2003061871-d.html
http://www.loc.gov/catdir/enhancements/fy0821/2003061871-t.html

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