Fault injection techniques and tools for embedded systems reliability evaluation /

Xehetasun bibliografikoak
Beste egile batzuk: Benso, Alfredo, Prinetto, Paolo
Formatua: Printed Book
Hizkuntza:English
Argitaratua: Boston : Kluwer Academic Publishers, c2003.
Saila:Frontiers in electronic testing ;
Gaiak:
Embedded computer systems > Testing.
Embedded computer systems > Reliability.
Fault location (Engineering)
Sarrera elektronikoa:http://www.loc.gov/catdir/enhancements/fy0821/2003061871-d.html
http://www.loc.gov/catdir/enhancements/fy0821/2003061871-t.html

Internet

http://www.loc.gov/catdir/enhancements/fy0821/2003061871-d.html
http://www.loc.gov/catdir/enhancements/fy0821/2003061871-t.html

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