Fault injection techniques and tools for embedded systems reliability evaluation /

Detaylı Bibliyografya
Diğer Yazarlar: Benso, Alfredo, Prinetto, Paolo
Materyal Türü: Printed Book
Dil:English
Baskı/Yayın Bilgisi: Boston : Kluwer Academic Publishers, c2003.
Seri Bilgileri:Frontiers in electronic testing ;
Konular:
Embedded computer systems > Testing.
Embedded computer systems > Reliability.
Fault location (Engineering)
Online Erişim:http://www.loc.gov/catdir/enhancements/fy0821/2003061871-d.html
http://www.loc.gov/catdir/enhancements/fy0821/2003061871-t.html
LEADER 01074cam a22002534a 4500
005 20160322165156.0
008 030814s2003 maua b 000 0 eng
020 |a 1402075898 (alk. paper) 
041 |a eng 
082 0 0 |a 004.031.6  |b BEN 
245 0 0 |a Fault injection techniques and tools for embedded systems reliability evaluation /  |c edited by Alfredo Benso and Paolo Prinetto. 
260 |a Boston :  |b Kluwer Academic Publishers,  |c c2003. 
300 |a xiv, 241 p. : 
440 0 |a Frontiers in electronic testing ;  |9 686 
650 0 |a Embedded computer systems  |x Testing.  |9 687 
650 0 |a Embedded computer systems  |x Reliability.  |9 688 
650 0 |a Fault location (Engineering)  |9 689 
700 1 |a Benso, Alfredo.  |9 690 
700 1 |a Prinetto, Paolo.  |9 691 
856 4 2 |u http://www.loc.gov/catdir/enhancements/fy0821/2003061871-d.html 
856 4 1 |u http://www.loc.gov/catdir/enhancements/fy0821/2003061871-t.html 
942 |c BK  |6 _ 
999 |c 155587  |d 155587 
952 |0 0  |1 0  |4 0  |6 0040316_BEN  |7 0  |9 203512  |a DCS  |b DCS  |c GEN  |d 2013-10-29  |o 004.031.6 BEN  |p MCS05336  |r 2013-10-29  |w 2013-10-29  |y BK 

Benzer Materyaller