Fault injection techniques and tools for embedded systems reliability evaluation /

Opis bibliograficzny
Kolejni autorzy: Benso, Alfredo, Prinetto, Paolo
Format: Printed Book
Język:English
Wydane: Boston : Kluwer Academic Publishers, c2003.
Seria:Frontiers in electronic testing ;
Hasła przedmiotowe:
Embedded computer systems > Testing.
Embedded computer systems > Reliability.
Fault location (Engineering)
Dostęp online:http://www.loc.gov/catdir/enhancements/fy0821/2003061871-d.html
http://www.loc.gov/catdir/enhancements/fy0821/2003061871-t.html
Opis
Opis fizyczny:xiv, 241 p. :
ISBN:1402075898 (alk. paper)

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