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Applied pattern recognition /

Sonraí Bibleagrafaíochta
Údair Eile: Bunke, Horst, Kandel, Abraham, Last, Mark
Formáid: Printed Book
Teanga:English
Foilsithe: New Delhi: Springer International, c2011.
Sraith:Studies in computational intelligence ;
Ábhair:

DCS

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