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Applied pattern recognition /

Detalles Bibliográficos
Outros autores: Bunke, Horst, Kandel, Abraham, Last, Mark
Formato: Printed Book
Idioma:English
Publicado: New Delhi: Springer International, c2011.
Series:Studies in computational intelligence ;
Subjects:
Search Result 1
Publicado 2008
Printed Book
Search Result 2
Publicado 2008
Printed Book