Bunke, H., Kandel, A., & Last, M. (2011). Applied pattern recognition. Springer International.
Chicago Edition CitationBunke, Horst, Abraham Kandel, and Mark Last. Applied Pattern Recognition. New Delhi: Springer International, 2011.
Deismireacht MLABunke, Horst, et al. Applied Pattern Recognition. Springer International, 2011.
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