APA aipamena

Bunke, H., Kandel, A., & Last, M. (2011). Applied pattern recognition. Springer International.

Chicago Style aipamena

Bunke, Horst, Abraham Kandel, and Mark Last. Applied Pattern Recognition. New Delhi: Springer International, 2011.

MLA aipamena

Bunke, Horst, et al. Applied Pattern Recognition. Springer International, 2011.