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Measurement technique for thin films [proceedings]

Detalhes bibliográficos
Autor principal:	Schwartz, Bertram (d. By)
Outros Autores:	Schwartz, Newton
Formato:	Printed Book
Idioma:	English
Publicado em:	New York The Electrochemical Society 1967
Assuntos:	Microelectronics > Electronics > Semiconductors > Thin films

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