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|a Adlib
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| 082 |
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|a 621.3.049.772.2:621.317
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| 245 |
|
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|a Measurement technique for thin films [proceedings]
|
| 250 |
|
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| 260 |
|
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|a New York
|b The Electrochemical Society
|c 1967
|
| 300 |
|
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|a vi, 364p.
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| 500 |
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|a Symposium sponsored by Electronics division of the electrochemical society
|
| 100 |
|
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|a Schwartz, Bertram
|e d. By
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| 700 |
|
|
|a Schwartz, Newton
|
| 942 |
|
|
|c BK
|6 _
|
| 653 |
|
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|a Microelectronics
|a Electronics
|a Semiconductors
|a Thin films
|
| 999 |
|
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|c 13325
|d 13325
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| 952 |
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|0 0
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|4 0
|6 62130497722621317_SCH
|7 0
|9 24790
|a UL
|b UL
|d 2010-06-16
|o 621.3.049.772.2:621.317 SCH
|p 00012845
|r 2010-06-16
|w 2010-06-16
|y BK
|