Measurement technique for thin films [proceedings]

书目详细资料
主要作者: Schwartz, Bertram (d. By)
其他作者: Schwartz, Newton
格式: Printed Book
语言:English
出版: New York The Electrochemical Society 1967
主题:
Microelectronics > Electronics > Semiconductors > Thin films
实物特征
Item Description: Symposium sponsored by Electronics division of the electrochemical society
实物描述:vi, 364p.

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