Measurement technique for thin films [proceedings]

Bibliografski detalji
Glavni autor: Schwartz, Bertram (d. By)
Daljnji autori: Schwartz, Newton
Format: Printed Book
Jezik:English
Izdano: New York The Electrochemical Society 1967
Teme:
Microelectronics > Electronics > Semiconductors > Thin films
Opis
Opis djela: Symposium sponsored by Electronics division of the electrochemical society
Opis:vi, 364p.

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