Measurement technique for thin films [proceedings]

Sonraí Bibleagrafaíochta
Príomhúdar: Schwartz, Bertram (d. By)
Údair Eile: Schwartz, Newton
Formáid: Printed Book
Teanga:English
Foilsithe: New York The Electrochemical Society 1967
Ábhair:
Microelectronics > Electronics > Semiconductors > Thin films
Cur Síos
Cur Síos ar an Mír: Symposium sponsored by Electronics division of the electrochemical society
Cur Síos Fisiciúil:vi, 364p.

Míreanna Comhchosúla