Measurement technique for thin films [proceedings]

Détails bibliographiques
Auteur principal: Schwartz, Bertram (d. By)
Autres auteurs: Schwartz, Newton
Format: Printed Book
Langue:English
Publié: New York The Electrochemical Society 1967
Sujets:
Microelectronics > Electronics > Semiconductors > Thin films
Description
Description: Symposium sponsored by Electronics division of the electrochemical society
Description matérielle:vi, 364p.

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