Measurement technique for thin films [proceedings]

Detalles Bibliográficos
Autor principal: Schwartz, Bertram (d. By)
Otros Autores: Schwartz, Newton
Formato: Printed Book
Lenguaje:English
Publicado: New York The Electrochemical Society 1967
Materias:
Microelectronics > Electronics > Semiconductors > Thin films
Descripción
Notas: Symposium sponsored by Electronics division of the electrochemical society
Descripción Física:vi, 364p.

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