Measurement technique for thin films [proceedings]

Bibliographic Details
Main Author: Schwartz, Bertram (d. By)
Other Authors: Schwartz, Newton
Format: Printed Book
Language:English
Published: New York The Electrochemical Society 1967
Subjects:
Microelectronics > Electronics > Semiconductors > Thin films
Description
Item Description: Symposium sponsored by Electronics division of the electrochemical society
Physical Description:vi, 364p.

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