Cargando...
Electrical conduction and dielectrical behavior of thin films of vaccum evaporated amorphus silicon, Hydrogenate amorphus silicon and chemically deposite cadmium sheets
Autor principal: | |
---|---|
Formato: | Ph.D Thesis |
Lenguaje: | English |
Publicado: |
Kochi
Dept. of Physics - CUSAT
1989
|
Materias: |
UL
Número de Clasificación: |
539.216:537.311:546.28 RAJ |
---|---|
Copia | Estatus de actividad no disponible |