Carregant...
Electrical conduction and dielectrical behavior of thin films of vaccum evaporated amorphus silicon, Hydrogenate amorphus silicon and chemically deposite cadmium sheets
Autor principal: | |
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Format: | Ph.D Thesis |
Idioma: | English |
Publicat: |
Kochi
Dept. of Physics - CUSAT
1989
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Matèries: |
UL
Signatura: |
539.216:537.311:546.28 RAJ |
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Còpia | Comprovació en temps real no disponible |